AEC-Q100 is the automotive industry’s standard stress-test qualification for integrated circuits. It assesses whether a semiconductor device can operate reliably under demanding automotive conditions, including sustained high temperatures, repeated write cycles and long operating life.
Weebit Nano has announced that its embedded ReRAM module has been qualified to the AEC-Q100 standard for non-volatile memory. The qualification included high-temperature cycling endurance, data retention post cycling, and High-Temperature Operating Life testing, with reliable operation demonstrated at 150°C and endurance of 100K cycles.
This matters to automotive chip designers because embedded non-volatile memory holds the code, data and security data that must remain available throughout a vehicle’s lifetime. AEC-Q100 qualification gives customers confidence that Weebit ReRAM meets key automotive-grade reliability requirements. The final chip or SoC will still need to complete its own product-level qualification.